Latest breakthroughs in semiconductor and electron device technology, design, manufacturing, physics, and modeling were presented by academic and industrial leaders from around the world.
WAKeMeUP presented 2 scientific papers from CEA-Leti :
“Reliability and Variability of 1S1R OxRAM-OTS for High density crossbar Integration”, D. Alfaro Robayo, G. Sassine, J. Minguet Lopez, L. Grenouillet, A. Verdy, G. Navarro, M. Bernard, E. Esmanhotto, C. Carabasse, E. Vianello, N. Castellani, L. Ciampolini, B. Giraud, C. Cagli, G. Guibaudo, E. Nowak, G. Molas, IEDM 2019, 7-11 Dec. 2019, San Francisco.
“OxRAM for embedded solutions on advanced node: scaling perspectives considering statistical reliability and design constraints”, J. Sandrini, L. Grenouillet, V. Meli, N. Castellani, I. Hammad, S. Bernasconi, F. Aussenac, S. Van Duijn, G. Audoit, M. Barlas, J.F. Nodin, O. Billouint, G. Molas, R. Fournel, E. Nowak, F. Gaillard, C. Cagli, IEDM 2019, 7-11 Dec. 2019, San Francisco.
Download the program : https://ieee-iedm.org/wp-content/uploads/2019/11/2019-IEDM-program-PRESS.pdf