- From CEA Leti
"Impact of roughness of TiN bottom electrode on the forming voltage of HfO2 based resistive memories"
Microelectronic Engineering Volume 221, 111194, 15 January (2020)
https://doi.org/10.1016/j.mee.2019.111194
- From UAB
"Self-Organizing Neural Networks Based on OxRAM Devices under a Fully Unsupervised Training Scheme"
Journal of Applied Physics 125, 234503 (2019)
https://doi.org/10.3390/ma12213482
