Defect-induced phase transition in hafnium oxide thin films: comparing heavy ion irradiation and oxygen engineering effects
T. Vogel, N. Kaiser, S. Petzold, E. Piros, N. Guillaume, G. Lefèvre, C. Charpin-Nicolle, S. David, C. Vallée, E. Nowak, C. Trautmann, L. Alff
IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2021.3085962.
